A simple moiré deflectometerSEN GUPTA, K; SARKAR, S. K; BASURAY, A et al.Optik (Stuttgart). 1991, Vol 87, Num 4, pp 147-150, issn 0030-4026Article

Sources of error in heterodyne moire deflectometryDECKER, A. J; STRICKER, J; WEIMER, D et al.Applied optics. 1988, Vol 27, Num 8, pp 1381-1383, issn 0003-6935Article

Direct determination of strain with diffraction-limit accuracy by moiré deflectometryKAFRI, O; KEREN, E; KRESKE, K. M et al.Optics letters. 1989, Vol 14, Num 4, pp 193-195, issn 0146-9592Article

Moiré deflectometry ― ray tracing interferometryGLATT, I; KAFRI, O.Optics and lasers in engineering. 1988, Vol 8, Num 3-4, pp 277-320, issn 0143-8166Article

Computer moire deflectometry using the Talbot effectVLAD, V. I; POPA, D; APOSTOL, I et al.Optical engineering (Bellingham. Print). 1991, Vol 30, Num 3, pp 300-306, issn 0091-3286, 7 p.Article

Feasibility of moiré deflectometry for measuring temperature and electron number density of rocket exhaust plumeCHEN, Yun-Yun; SONG YANG; LI, Zhen-Hua et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7848, issn 0277-786X, isbn 978-0-8194-8378-2, 78480B.1-78480B.10Conference Paper

Automatic fringe detection algorithm used for moire deflectometrySERVIN, M; RODRIGUEZ-VERA, R; CARPIO, M et al.Applied optics. 1990, Vol 29, Num 22, pp 3266-3270, issn 0003-6935Article

Nonparaxial method for computing the gradient field of a wavefront using moiré deflectometryLEGARDA-SAENZ, R; RODRIGUEZ-VERA, R; RIVERA, M et al.Optics communications. 1999, Vol 160, Num 4-6, pp 214-218, issn 0030-4018Article

Applications of optical logic-operated moiré in moiré topography and deflectometryJIAJUN ZHANG; LI ZHANG; ANZHI HE et al.Applied optics. 1992, Vol 31, Num 34, pp 7355-7360, issn 0003-6935Article

Electronic moiré deflectometrySHARMA, D. K; DELISLE, C.Optics communications. 1987, Vol 64, Num 3, pp 211-216, issn 0030-4018Article

Circular grating moiré deflectometry analysis by zeroth and first radial fringe order angle measurementNG, T. W.Optics communications. 1996, Vol 129, Num 5-6, pp 344-346, issn 0030-4018Article

Retroreflective moiré deflectometry using a telescopeLIASI, E; NORTH, W. P. T.Optical engineering (Bellingham. Print). 1994, Vol 33, Num 11, pp 3723-3726, issn 0091-3286Article

Comparison and combined operation of a moire deflectometer, Fizeau interferometer, and schlieren deviceKAFRI, O; KRESKE, K.Applied optics. 1988, Vol 27, Num 23, pp 4941-4946, issn 0003-6935Article

Unified theory for the optical transfer function: ray-optical approachKEREN, E; LIVNAT, A; KAFRI, O et al.Journal of the Optical Society of America. A, Optics and image science. 1988, Vol 5, Num 8, pp 1213-1225, issn 0740-3232Article

Determination of the focal length of nonparaxial lenses by moire deflectometryGLATT, I; KAFRI, O.Applied optics. 1987, Vol 26, Num 13, pp 2507-2508, issn 0003-6935Article

Refractive index measurement of optical windows by an interferometric-deflectometric methodKAFRI, O; KRESKE, K. M; KEREN, E et al.Applied optics. 1988, Vol 27, Num 22, pp 4602-4603, issn 0003-6935Article

Study of the thickness of liquid layers by moiré deflectometryYOGEV, D; EFRIMA, S; KAFRI, O et al.Optics letters. 1988, Vol 13, Num 10, pp 934-936, issn 0146-9592Article

Structure of burning n-hexane droplet by Moiré DeflectometrySHARMA, D. K; STEPHEN, S; NATARAJAN, R et al.Combustion science and technology. 1998, Vol 131, Num 1-6, pp 305-321, issn 0010-2202Article

Error sources in deferred heterodyne moire deflectometry: an analytical studySTRICKER, J.Applied optics. 1989, Vol 28, Num 18, pp 3972-3978, issn 0003-6935Article

Two-color double exposure photographic recording techniqueSTRICKER, J.Applied optics. 1989, Vol 28, Num 10, pp 1822-1825, issn 0003-6935Article

Performance of moiré deflectometry with deferred electronic heterodyne readoutSTRICKER, J.Journal of the Optical Society of America. A, Optics and image science. 1987, Vol 4, Num 9, pp 1798-1806, issn 0740-3232Article

Nulltest for aspherical microlenses using Moiré deflectometryBAI, A; SCHNEEFUSS, K; PFEIFER, T et al.euspen : european society for precision engineering and nanotechnology. International conference. 2001, pp 486-489, 2VolConference Paper

Phase-shifting Moiré deflectometryPFEIFER, T; WANG, B; EVERTZ, J et al.Optik (Stuttgart). 1995, Vol 98, Num 4, pp 158-162, issn 0030-4026Article

The measurement of deformation of a bridge by moiré photography and photogrammetry = Mesures de déformation sur un pont par photographie moiré et par photogrammétrieFORNO, C; BROWN, S; HUNT, R. A et al.Strain. 1991, Vol 27, Num 3, pp 83-85, issn 0039-2103Article

A novel technique for X-ray laser beam characterizationAFSHAR-RAD, T; WILLI, O.Applied physics. B, Photophysics and laser chemistry. 1990, Vol 50, Num 4, pp 287-290, issn 0721-7269, 4 p.Article